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INVITED:
Resolution enhanced technologies in optical metrology |
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10:45 |
StaFF : Nanometre precision
interferometers for the International Linear Collider P Coe, A J Reichold, D Urner |
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11:00 |
2l-contouring with digital holography using a fs-pulse laser J Müller, C Falldorf,
W Jüptner Bremen
Institute for applied beam technologies BIAS ( |
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11:15 |
Fast
three-dimensional Hough transform for automated calibration
of multiple 3-D sensors O Ogundana, C Coggrave1, R Burguete2, J
Huntley 1 Phase Vision Ltd. ( 2 Airbus |
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11:30 |
Phase-stepped
gauge block interferometry in a Fizeau
interferometer using a frequency-tunable visible laser diode M O'Hora, B Bowe,
V Toal Centre
for Industrial and Engineering Optics ( |
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11:45 |
Phase
and colour extraction for colour
fringe projection system based on optimum frequency selection Z Zhang, C Towers1, D Towers1 1 University of |
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12:00 |
Analytic
Phase-to-Height Model for Measuring Object Shape Using Structured B Rajoub, M Lalor, D R |